Donald Cohen

In 1994, Dr. Cohen established Michigan Metrology to help engineers and scientists solve problems related to “Squeaks, leaks, friction, wear, appearance, adhesion and other issues,” using 3D Surface MicroTexture Measurement and Analysis.

Dr. Cohen is a past Chairman of the STLE-Detroit section and has been active with the ASME B46.1 committee on surface texture since 1988, having served as Chair from 2005-2011. Dr. Cohen is also a Subject Matter Expert for the ISO surface metrology activities.

Dr. Cohen has an undergraduate degree in Physics from the University of Michigan, Dearborn, and graduate degrees in Physics and Optical Sciences from the University of Arizona. Early in his career, Dr. Cohen worked with IBM on optical disk drive development. He later joined WYKO Corporation as Product Manger and later became Vice President, leading the development of 3D surface texture metrology instrumentation.

Dr. Cohen has developed this class over the past 20 years having presented the material at numerous client locations as part of his training and consulting activities. Typically once a year the class is offered to a general audience in the Livonia, MI area.