
Explain how x-rays form from rapid electron deceleration. Describe continuous spectrum and characteristic x-rays, including k alpha and k beta lines, Moseley’s law, and filters.
Understand absorption edge as a jump in mass absorption coefficient guiding filters and monochromators in x-ray diffraction, with beam geometry and detectors enabling powder and texture analyses.
Explore how peak intensity in x-ray diffraction depends on polarization, atomic scattering and structure factors, multiplicity, Lorentz polarization factors, absorption, and temperature factors, tied to lattice spacing and atom positions.
Determine phase boundaries in x-ray diffraction by constructing tie lines and applying disappearing phase and parametric methods to map the solvus line.
Explore how x-ray diffraction reveals stress and enables chemical analysis in metals, distinguishing uniform macro strain that shifts diffraction peaks from non-uniform microstrain that broadens them, and identifying residual stress.
Analyze texture with x-ray diffraction to reveal macro texture, fiber components, and orientation distributions, differentiating random from textured materials and linking deformation and recrystallization textures to anisotropic properties and applications.
Explore how Euler angles describe orientation through rotation sets, build orientation matrices, and model texture via orientation distribution functions in Euler space.
This course provides a comprehensive introduction to X-ray Diffraction (XRD), a cornerstone technique in materials science, physics, chemistry, geology, and engineering. Students will explore the theoretical foundations of XRD, beginning with the principles of X-ray generation, interaction with matter, and Bragg’s Law. The course delves into crystal structures, lattice parameters, and the mathematics of diffraction patterns, offering a clear understanding of how atomic arrangements influence observed data.
Participants will learn how to operate XRD instruments, prepare samples, and interpret diffraction patterns. The course covers both single-crystal and powder diffraction methods, with a strong focus on real-world applications including phase identification, crystallite size estimation, strain analysis, and qualitative/quantitative phase analysis and texture analysis.
By the end of the course, students will be equipped with the theoretical knowledge and technical skills necessary to independently design and execute XRD experiments, analyze data, and draw meaningful conclusions.
This course is ideal for undergraduate and graduate students, researchers, and industry professionals seeking to deepen their understanding of crystallographic techniques and materials characterization using XRD and texture analysis. This course equips researchers with advanced skills in XRD data analysis, phase identification, and crystal structure refinement. It enhances experimental design proficiency, introduces modern software tools, and supports interpretation of complex diffraction patterns—enabling high-precision materials characterization essential for cutting-edge research in materials science, chemistry, physics, and nanotechnology.