
Explore optical principles of light microscopes, including resolution, magnification, and depth of focus, and the infinity corrected design with objective, tube lens, and eyepiece.
Explore how brightness, contrast, and depth of field govern resolution in light and transmission microscopes, influenced by numerical aperture, magnification, and lens aberrations.
Explore the optical microscope illumination system, including the Keeler setup, condenser lens, aperture and field planes, diaphragms, and filters, then examine objective and eyepiece aberration markings and micrometer use.
Explore imaging modes of a light microscope, including bright field, dark field, phase contrast, polarization microscopy, and Nomarski differential interference contrast, highlighting anisotropy, birefringence, and three-dimensional relief.
Explore three-dimensional confocal microscopy and its optical resolution for biological samples, using a laser light beam, scanning device, and pinhole aperture to build a three-dimensional image revealed by fluorescent dye.
Compare light and transmission electron microscopes, highlighting TEM's higher resolution (about 0.2 nm) and the use of high vacuum, electromagnetic lenses, and electron beam.
Explore mass thickness and diffraction contrast in transmission electron microscopy, and learn to distinguish thickness effects from lattice distortion; note that tilt alters diffraction contrast, unlike mass thickness.
Explore how single and multiple scattering govern kinematic and dynamical diffraction in transmission electron microscopy, including the extinction distance and the role of crystal potential.
Explore how electromagnetic lenses shape transmission electron microscope imaging, including aberrations, aperture control, and the diffraction and image modes with bright-field, dark-field, and centered dark-field imaging.
Learn to form and index diffraction patterns in a transmission electron microscope. Use aperture adjustments and lens realignment to map reciprocal lattice and determine zone axis orientation.
Explore how diffraction arises in perfect crystals, linking real and reciprocal lattices to Bragg conditions and Ewald sphere geometry, and show how camera length controls diffraction spot patterns.
Explore how excitation error s offsets the Bragg condition, producing elongated reciprocal-lattice rods and dynamic diffraction with intensity exchange between transmitted and diffracted beams in TEM.
Explore how thickness fringes and bend contours create diffraction contrast in transmission electron microscopy, detailing the phase amplitude diagram, wedge thickness, strain gradients, and extinction distance.
Explore how defects in crystals cause diffraction contrast via displacement vectors that modify the wave equation, revealing grain boundaries, edge and screw dislocations, and multiple phases.
Explain the invisibility and extinction criteria in TEM, where g dot r and delta k dot b govern dislocation visibility, with screw, edge dislocations, stacking faults, and antiphase boundaries.
Explore weak beam dark-field imaging revealing sharp dislocation lines near cores. Examine Kikuchi patterns and convergent beam diffraction disks to assess thickness, lattice parameters, and crystal symmetry.
Explore phase contrast in transmission electron microscopy, where multiple-beam interference forms lattice fringes to reveal atomic structure in thin specimens; STEM and energy loss spectroscopy enable imaging and elemental analysis.
This course provides a foundational understanding of light microscopy and transmission electron microscopy (TEM), two essential techniques for imaging and analyzing microstructures in materials and biological specimens. Designed for students and early-career researchers, the course introduces the operating principles, instrumentation, and applications of both light and electron microscopy. The first part of the course focuses on light microscopy, covering concepts such as magnification, resolution, contrast mechanisms (bright field, dark field, and phase contrast), and sample preparation methods. Emphasis is placed on optical limitations, imaging artifacts, and practical usage in routine lab analysis. The second part introduces transmission electron microscopy, delving into electron-matter interactions, beam generation, electromagnetic lenses, and image formation. Students will learn how to interpret TEM images, understand diffraction patterns, and appreciate the high-resolution capabilities of electron microscopy. By the end of the course, students will be equipped with the fundamental knowledge and practical awareness required to select appropriate microscopy techniques, prepare samples effectively, and critically interpret microscopic images for research and development purposes. This intensive course introduces the core principles and practical aspects of light and transmission electron microscopy (TEM), focusing on their applications in materials characterization. Designed for professionals, researchers, and graduate students, the course offers a concise overview of imaging fundamentals, resolution limits, contrast mechanisms, and sample preparation techniques. Participants will learn how to operate optical microscopes for routine inspection and understand the capabilities of TEM for high-resolution analysis of microstructures, interfaces, and defects. Key topics include diffraction patterns, beam-sample interactions, and contrast interpretation. Emphasis is placed on selecting the right technique for specific applications and recognizing imaging artifacts.