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Advanced Materials Characterization Techniques (Analytical)
Rating: 4.6 out of 5(80 ratings)
310 students

Advanced Materials Characterization Techniques (Analytical)

From Microscopy to Spectroscopy: A Comprehensive Approach, Electron Microscopy, Thermal analysis, X-ray Diffraction
Created byKhurshid Ayub
Last updated 11/2024
English

What you'll learn

  • Students will learn the fundamental principles of various advanced materials characterization techniques and describe their applications in Materials analysis
  • Develop the ability to understand and explain results produced by advanced materials characterization techniques
  • Students will be able to critically assess and select appropriate characterization techniques for different types of materials based on strengths and limitatons
  • Students will apply advanced characterization techniques to solve real-world materials challenges, demonstrating critical thinking and problem-solving skills

Course content

11 sections42 lectures7h 46m total length
  • Introduction4:41

Requirements

  • No Specific Pre-Requisite. A general science background knowledge is sufficient

Description

This course provides an in-depth exploration of cutting-edge techniques used to characterize materials at the micro and nanoscale. Designed for graduate students and professionals in materials science, engineering, and related fields, the course will cover a range of advanced characterization methods, including:

  • Electron Microscopy: Techniques such as Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM), Auger Electron Microscopy for high-resolution imaging and analysis.

  • X-ray Diffraction (XRD

  • Spectroscopic Methods: in depth understanding of spectroscopic techniques like  Raman Spectroscopy, energy dispersive x-ray spectroscopy, and x-ray photoelectron spectroscopy.

  • Thermal Analysis: Exploring Differential Scanning Calorimetry (DSC), differential thermal analysis (DTA) and Thermogravimetric Analysis (TGA) to study thermal properties.

  • Atomic Force Microscopy: Microscopy at the level will be studied through Atomic force microscopy commonly known as AFM.


Through a series of lectures, and case studies, students will gain practical experience in selecting and applying the appropriate characterization techniques for various materials. The course will also emphasize the importance of data interpretation and the role of advanced characterization in materials development and innovation.

By the end of the course, participants will be equipped with the skills and knowledge necessary to conduct comprehensive materials characterization, enabling them to contribute to advancements in material design and application across multiple industries. This course focuses on principles, instrumentation concepts, and interpretation, rather than hands-on operation or laboratory training on the instruments.


Who this course is for:

  • The course aims to provide a comprehensive understanding of advanced materials characterization techniques, enabling students to leverage these methods to advance their research, enhance material performance, and contribute to technological innovations. This course is particularly helpful for: Graduate Students, Research Professionals, Materials Scientists, Materials Engineers and Interdisciplinary scientist